Filed by Nanometrics Incorporated
Pursuant to Rule 425
under the
Securities Act of 1933, as amended
and deemed filed pursuant to Rule 14a-6(b)
under the Securities Exchange Act of 1934, as amended
Subject Company: Rudolph Technologies, Inc.
(Commission File No. 001-36226)
News
Nanometrics and
Rudolph Technologies Jointly Announce Combined
Company is Expected to Hold 2019 Third Quarter Financial Results
Conference Call on November 7, 2019
MILPITAS, Calif. and WILMINGTON, Mass. October 14, 2019 Nanometrics Incorporated (NASDAQ: NANO) and Rudolph Technologies, Inc.
(NYSE: RTEC), today announced they expect to jointly release 2019 third quarter financial results after the market closes on Thursday, November 7, 2019, subject to the closing of their previously announced merger of equals, which is expected to
close before the end of October, subject to receipt of requisite stockholder approvals and satisfaction of other customary closing conditions. In conjunction with this anticipated joint release, the combined company is expected to host a conference
call, which will be broadcast live over the internet. The call will take place:
November 7, 2019 at 4:30 p.m. (ET)
To participate in the call, please dial 888-394-8218 (Domestic) or +1-720-452-9217 (International), reference confirmation code 3449338 at least five (5) minutes prior to the scheduled start time.
A live webcast will also be available at www.nanometrics.com and www.rudolphtech.com.
To listen to the live webcast, please go to the
website at least fifteen (15) minutes early to register, download and install any necessary audio software.
There will be a replay of the conference
call available from 7:30 p.m. ET on November 7 until 7:30 p.m. ET on November 14, 2019. To access the replay, please dial 888-203-1112 (Domestic) or +1-719-457-0820 (International) at any time during that period and use audio replay passcode 34493384. A replay will also be available
at www.nanometrics.com and www.rudolphtech.com.
About Nanometrics
Nanometrics Incorporated (Nanometrics) is a leading provider of advanced, high-performance process control metrology and inspection solutions used
primarily in the semiconductor manufacturing industry, as well as in the fabrication of other solid-state devices and components in the optoelectronic, LED and storage industries, and more recently in the industrial, aerospace and scientific
research markets. Nanometrics process control solutions include automated and integrated metrology systems as well as software and analytics that measure and monitor key elements of device performance and yield, such as critical dimensions,
device structures, surface shape and profile, overall topography and various thin film properties, including three-dimensional features and film thickness, as well as the optical, electrical and material properties of various