Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables video-rate imaging with line scan rates up to 1250 lines/s and frame rates up to 45 frames/s. The Vero VRS1250 is the first and only video-rate AFM to incorporate Quadrature Phase Differential Interferometry (QPDI) cantilever sensing technology, which enables AFM measurements to be made with much higher accuracy and precision. It also includes Asylum’s exclusive blueDrive photothermal excitation technology, which makes high-speed imaging simpler and more stable. This unique combination of three cutting-edge technologies makes the Vero VRS1250 the most advanced AFM in the market.

“The research possibilities enabled by the Vero VRS1250 are limitless considering that it combines three of our most advanced technologies—QPDI, video-rate scanning, and blueDrive photothermal excitation,” said Dr. Ben Ohler, Senior Product Marketing Manager for Vero. “The Vero family builds on the ultra-high performance, stability, and capabilities of Asylum’s Cypher AFM family, which have been the AFMs of choice for advanced research. Now, the Vero AFM family leads the way, enabling the breakthroughs of tomorrow.”

Vero AFM was recently recognized for technology innovation by R&D Magazine with their 2024 R&D 100 Award and by Frost and Sullivan with their 2024 Best Practices New Product Innovation Award. Built on the unrivalled stability and performance of the Cypher AFM platform, Vero AFM family now consists of three models that build in capability, where the Vero S supports ambient AFM measurements, the Vero ES adds advanced environmental control capabilities, and the Vero VRS1250 adds video-rate imaging. Options for upgrading Cypher S/ES/VRS to Vero S/ES/VRS available. For more information about these upgrades, contact mailto:AFM.info@oxinst.com.

For more information see https://afm.oxinst.com/Vero-VRS1250

About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical, and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher, MFP-3D, Jupiter, and Vero AFM product lines span a wide range of performance, versatility, and budgets.

David Beck Oxford Instruments Asylum Research Inc. E: David.beck@oxinst.com | T: +1-805-696-6466

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