Zoughi to Receive 2011 IEEE Joseph F. Keithley Award for Contributions to Microwave and Millimeter Wave Measurement Techniques
02 November 2010 - 2:00PM
Business Wire
The IEEE has named Dr. Reza Zoughi as the recipient of the 2011
IEEE Joseph F. Keithley Award in Instrumentation and Measurement.
Zoughi is being recognized for his contributions to microwave and
millimeter wave measurement techniques for nondestructive testing
and evaluation. The award, sponsored by Keithley Instruments, Inc.
(NYSE:KEI), is presented for outstanding contributions in the field
of electrical measurement. It consists of a bronze medal, a
certificate, and an honorarium. The award will be presented to
Zoughi on May 11, 2011, during the IEEE International
Instrumentation and Measurement Technology Conference, which will
be held at the Four Points by Sheraton Hangzhou, Binjiang,
Hangzhou, China.
Zoughi, a Fellow of the Institute of Electrical and Electronics
Engineers (IEEE), received his B.S.E.E, M.S.E.E, and Ph.D. degrees
in electrical engineering (radar remote sensing, radar systems, and
microwaves) from the University of Kansas. Currently, he is the
Schlumberger Distinguished Professor of Electrical and Computer
Engineering at Missouri University of Science and Technology
(Missouri S&T, formerly University of Missouri-Rolla). Zoughi’s
efforts, in the past two decades, in expanding the utility of
microwave and millimeter wave inspection techniques have brought
significant recognition to the field of Nondestructive Testing and
Evaluation (NDT&E). Zoughi’s research team has developed
millimeter wave imaging systems and methods for inspecting the
spray-on foam insulation (SOFI) of the space shuttle’s external
fuel tank, in addition to a real-time, high-resolution and portable
microwave camera that is expected to find widespread utility. He
has played a leading role in developing near-field microwave and
millimeter wave techniques and developed near-field measurement
systems using open-ended waveguide and other more sophisticated
probes for evaluating a host of defects in thin and thick and
layered composite structures.
Criteria considered by the award's IEEE Evaluation Committee
include innovation or development, social value, uniqueness of
concept, other technical accomplishments, and the quality of the
nomination. The award is administered through the Technical Field
Awards Council of the IEEE Awards Board and is independent of
Keithley Instruments. For additional information on IEEE Technical
Field Awards and Medals, to view complete lists of past recipients,
or to nominate a colleague or associate for IEEE Technical Field
Awards and Medals, please visit http://www.ieee.org/awards.
About IEEE.
IEEE is the world’s largest professional association dedicated
to advancing technological innovation and excellence for the
benefit of humanity. IEEE and its members inspire a global
community through IEEE's highly cited publications, conferences,
technology standards, and professional and educational
activities.
For More Information
For more information on Keithley Instruments, contact the
company at:
Telephone: 888-534-8453 440-248-0400 FAX: 440-248-6168
E-mail:
publisher@keithley.com
Internet:
www.keithley.com
Address: Keithley Instruments, Inc. 28775 Aurora Road Cleveland, OH
44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley
Instruments has become a world leader in advanced electrical test
instruments and systems. Our customers are scientists and engineers
in the worldwide electronics industry involved with advanced
materials research, semiconductor device development and
fabrication, and the production of end products such as portable
wireless devices. The value we provide them is a combination of
products for their critical measurement needs and a rich
understanding of their applications to improve the quality of their
products and reduce their cost of test.
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