ADE Receives Multi-Tool Order From Major Asian Silicon Wafer Supplier; Inline Wafer Metrology Systems to Support Ongoing 300mm C
09 Februar 2006 - 5:45PM
Business Wire
ADE Corporation (NASDAQ: ADEX) announced today that it has received
a multi-million dollar order for several advanced 300mm wafer
metrology tools from a leading Asian silicon wafer manufacturer.
Deliveries of ADE's inline nanotopography and wafer flatness and
geometry measurement systems are expected to be completed in the
first half of calendar 2006 to support this customer's ongoing
300mm silicon wafer capacity expansion plans. "We are pleased to
announce this follow-on order and look forward to continuing our
partnership with this long standing customer", said Dr. Chris L.
Koliopoulos, ADE's president and chief executive officer. "This
multi-system order highlights ADE's market leadership position in
providing a breadth of advanced inline metrology solutions that is
critical in achieving the yield initiatives of the semiconductor
industry" continued Dr Koliopoulos. "Continuing expansion of 300mm
wafer capacity, coupled with tighter performance specifications
required for shrinking design rules, are key factors supporting our
revenue growth strategy." Gartner Dataquest estimates that 300mm
wafer demand will grow by 28.7% annually from 2006 to 2008. Fueling
this growth in needed wafer capacity, nineteen new semiconductor
device fabs are planned to start or ramp production on 300mm wafers
over the next three years. In response, all major wafer suppliers
continue to invest in additional 300mm production capacity. Wafer
suppliers and device manufacturers worldwide rely on ADE inspection
and measurement systems to certify and ensure the highest quality
bare silicon substrates. ADE's most recent generation of products
serve both 65nm inline manufacturing applications and 45nm process
development. Device yields begin with the bare wafer and ADE's
leading technology provides early insight to surface defect, shape,
flatness and nanotopography of advanced 300mm substrates. About ADE
Corporation ADE Corporation is a leading supplier of metrology and
inspection systems for the semiconductor wafer, semiconductor
device, magnetic data storage and optics manufacturing industries.
The Company's systems analyze and report product quality at
critical manufacturing steps for yield enhancement, providing
quality certification data that is relied upon by semiconductor
wafer, device and computer disk manufacturers. The Company's
systems also are used for production measurements in the
semiconductor chip fabrication process. To learn more about ADE,
visit the Company's Web site at www.ade.com. Safe Harbor This news
release contains certain forward-looking statements that are
subject to known and unknown risks and uncertainties that could
cause actual results to differ materially from those expressed or
implied by such statements. Those statements that make reference to
the Company's expectations, predictions, beliefs, assumptions and
anticipations should be considered forward-looking statements.
These statements include, but are not limited to, those associated
with the shipment of product to the aforementioned silicon wafer
supplier, the effect of ADE products on customer product quality
and production rates, and expected 300mm silicon wafer demand.
These statements involve risks and uncertainties including those
associated with wafer pricing and wafer demand; the results of
ADE's product development efforts; and the success of it's product
offerings to meet customer needs within the timeframes required by
customers in these markets. Further information on potential
factors that could affect ADE Corporation's business is described
in the Company's reports on file with the Securities and Exchange
Commission, including its Form 10-K for the fiscal year ended April
30, 2005.
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