Infineon Technologies Joins Semiconductor Test Consortium's Growing Roster of Global Semiconductor Industry Leaders
02 August 2006 - 3:39PM
PR Newswire (US)
Consortium's Latest Addition Underscores Widespread European
Support of the OPENSTAR Standard SAN DIEGO, Aug. 2 /PRNewswire/ --
The Semiconductor Test Consortium, Inc. (STC), the leading
proponent of worldwide adoption of the Open Semiconductor Test
Architecture (OPENSTAR(R)) standard, today announced that Infineon
Technologies AG (NYSE: IFX; FSE) of Munich, Germany, has joined the
consortium's global roster. The welcome addition of this top
chipmaker marks yet another milestone for the STC, whose European
membership now comprises 13 companies -- 28 percent of the total
corporate membership. These members are integral to the
consortium's recent evolution into a fully functioning ecosystem of
worldwide semiconductor industry leaders, and further validate
European support of the STC's ability to create and implement a
truly open, common test architecture for vendors throughout the
automated test equipment (ATE) sector. "Infineon has a wide product
portfolio ranging from discretes to power, automotive to RF, and
mixed-signal ICs," explained Klaus Luther, Infineon's senior
director of corporate test technology and STC co-vice chairman. "We
count on the open platform concept to enable a higher degree of
flexibility of our assets as well as better re-use of the
competencies of our test engineers across several applications and
product generations. It is Infineon's intention to eliminate
redundant R&D expenses, such as switching cost by architecture,
along with interface and software convergence of our test
solutions." STC Secretary and Administrator Bob Helsel added,
"Having prominent European companies such as Infineon join our
existing members further strengthens the burgeoning OPENSTAR
ecosystem. The STC values the strength and knowledge base that
these international companies bring to the consortium. We look
forward to their future contributions and leadership as we continue
to drive open hardware, software and interface standards that
provide significant economic and infrastructural benefits
associated with the longevity and scalability of the open
architecture defined by the STC." The next STC European general
meeting will be held September 19 in Munich, Germany. The next U.S.
STC meeting is scheduled for August 15-16 in Boston, Mass. Designed
to enable open-architecture test solutions that offer true hardware
and software interoperability with unparalleled technical and
economic benefits, the OPENSTAR platform is now supported by a
total of 86 global members, consisting of semiconductor, equipment
and instrumentation companies, universities, standard test
interference language (STIL) users, and individuals. With its
STC-outlined standard specifications, the architecture is
accessible to all test-product vendors, enabling them to offer
best-in-class, fully OPENSTAR-certified test solutions. In
addition, the highly scalable and flexible OPENSTAR platform
provides inherent extendibility in performance to meet emerging
test requirements. About the Semiconductor Test Consortium The
Semiconductor Test Consortium was founded in 2003 to develop a
common test architecture that is completely open, documented and
supported via solutions available from all ATE vendors. Open to all
companies throughout the semiconductor supply chain with a vested
interest in the test sector, the consortium is focused on the
following goals: driving the direction of OPENSTAR; publishing the
architecture and providing training programs and workshops to
ensure it is truly open; and defining and managing validation
procedures to ensure full vendor interoperability. Today, 47
semiconductor, equipment and instrumentation companies worldwide
and 27 universities in Europe, Japan, China and the United States,
in addition to eight STIL users and four individuals support the
STC. More information can be found at http://www.semitest.org/.
NOTE: OPENSTAR is a registered trademark of the Semiconductor Test
Consortium. DATASOURCE: Semiconductor Test Consortium CONTACT: Bob
Helsel of Semiconductor Test Consortium, +1-303-652-1311, or ; or
Ellen Van Etten of MCA, +1-650-968-8900, or , for Semiconductor
Test Consortium Web site: http://www.semitest.org/
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